Scanning Electron Microscopy (SEM)

SEM comprises a set of techniques related to the interaction of an electron beam as it scans the surface of a sample. Secondary electrons (SE), backscattered electrons (BSE), X rays, Auger electrons and others elements are generated and provides information about surface topography, composition and other properties of the sample. The inclusion of a Field Emission Gun (FEG) source allows resolutions below 2 nm.

Equipment:

FEI Quanta 250 FEG Scanning Electron Microscope

• Cellular characterization 
• Tissue characterization
• Biomaterials characterization 
• Macromolecular complexes characterization