Scanning Electron Microscopy (SEM)

Developed by: Centro Andaluz de Nanomedicina y Biotecnología BIONAND

Description

SEM comprises a set of techniques related to the interaction of an electron beam as it scans the surface of a sample. Secondary electrons (SE), backscattered electrons (BSE), X rays, Auger electrons and others elements are generated and provides information about surface topography, composition and other properties of the sample. The inclusion of a Field Emission Gun (FEG) source allows resolutions below 2 nm.


Equipment:

FEI Quanta 250 FEG Scanning Electron Microscope

Applications

  • Cellular characterization 
  • Tissue characterization
  • Biomaterials characterization 
  • Macromolecular complexes characterization

Juan Félix López

jflopez@bionand.es

952 367 607